Center for High Technology Materials 1313 Goddard SE Rm. 145 Albuquerque NM 87106, USA Tel: 505 272 7800  Fax: 505 272 7801 E-mail Conference Papers Abraham Bers and S.R.J. Brueck Interactions of Acoustic Waves with Electrons in Applied Electric and Magnetic Fields, in Proceedings 10th International Conference on the Physics of Semiconductors, S. P. Keller, J. C. Hensel and F. Stern, eds., (USAEC, Oak Ridge, 1970) S.R.J. Brueck Spin-Flip Raman Scattering Proceedings 12th International Conference on the Physics of Semiconductors, M. H. Pilkuhn, ed., (B. G. Teubner, Stuttgart, 1974), p. 780 S.R.J. Brueck, T.F. Deutsch, Helge Kildal and R.M. Osgood, Jr. Vibrational Kinetics in Cryogenic Liquids and Applications to Nonlinear Optics Laser Spectroscopy, SPIE 58, 122 (1978) H. Kildal, S.R.J. Brueck and N. Menyuk Efficient Frequency Conversion Techniques for CO2 Lasers Proceedings of the Electrooptics/Laser '79 Conference (Industrial and Scientific Conference Management, Chicago, IL, 1979) pp. 106-109 S.R.J. Brueck and Helge Kildal Nonlinear Optics of Cryogenic Liquids in Lasers and Applications, W.O.N. Guimaraes, C.-T. Lin and A. Mooradian, eds. (Springer-Verlag, Berlin, 1981), pp. 147-154 S.R.J. Brueck Raman Scattering as a Probe of Thin Films Proceedings of Workshop on Diamondlike Carbon Films B. Bendow, ed. (The BDM Corporation, Albuquerque, 1983) D.J. Ehrlich, S.R.J. Brueck and J.Y. Tsao Surface Electromagnetic Waves in Laser Material Interactions MRS Proceedings: Laser-Solid Interactions and Transient Thermal Processing of Materials, J. Narayan, W. L. Brown and R. A. Lemons, eds. (North-Holland, New York, 1983) S. Pang and S.R.J. Brueck Laser-Induced Fluorescence Diagnostics of CF4/O2/H2 Plasma Etching MRS Proceedings: Laser Diagnostics and Photochemical Processing for Device Materials, R. M. Osgood, S.R.J. Brueck and H. R. Schlossberg,eds. (North-Holland, New York, 1983) D.V. Murphy and S.R.J. Brueck Optical Microanalysis of Small Device Structures MRS Proceedings: Laser Diagnostics and Photochemical Processing for Device Materials, R. M. Osgood, S.R.J. Brueck and H. R. Schlossberg, eds. (North-Holland, New York, 1983) S.R.J. Brueck, T.F. Deutsch and D.E. Oates Surface Photoacoustic Wave Spectroscopy of Adsorbed Molecules Proceedings Sixth Intl. Conf. Laser Spectroscopy H.P. Weber and W. Luthy, eds. (Springer-Verlag, Berlin, 1983) D.E. Oates, S.R.J. Brueck and T.F. Deutsch Surface-photoacoustic-wave Spectroscopy of Thin Films Proceedings 1983 Ultrasonics Symposium S.R.J. Brueck, D.J. Ehrlich, D.V. Murphy and J.Y. Tsao Electromagnetically-induced Surface Microstructures and Enhanced Field Effects in Laser Processing MRS Proceedings: Laser-Controlled Chemical Processing of Surfaces, A. Wayne Johnson and D.J. Ehrlich, eds. (North-Holland, New York, 1984) S.R.J. Brueck Optical Microanalysis of Device Materials and Structures Laser Processing and Diagnostics D. Bauerle, ed. (Springer-Verlag, Berlin, 1984) S.R.J. Brueck, V. Diadiuk, T. Jones and W. Lenth High-Speed Internal Photoemission Detectors Enhanced by Grating Coupling to Surface Plasma Waves Proceedings of OSA Topical Conference: Picosecond Optics and Optoelectronics (Springer-Verlag, 1985) M.Y.A. Raja, S.R.J. Brueck, M. Osinski and J. McInerney Degradation of Photoluminescence Efficiency in GaAs under Low Intensity Laser Irradiation MRS Proceedings: Advanced Surface Processes for Optoelectronics, T. Venkatesan, S. Bernasek, G. Stillman and H. Temkin, eds. (Materials Research Society 126 265,1988) S.R.J. Brueck, M.Y.A. Raja, M. Osinski, C.F. Schaus, M. Mahbobzadeh, J.G. McInerney, and K.J. Dahlhauser Optical Cavity Design for Wavelength-Resonant Surface-Emitting Semiconductor Lasers SPIE Proc. Vol. 1043, Diode Laser Technology and Applications, 111-122 (1989) M. Mahbobzadeh, M.Y.A. Raja, J.G. McInerney, C.F. Schaus and S.R.J. Brueck Mode Stability and Spectral Properties of Resonant Periodic Gain Surface-Emitting Lasers SPIE Proceedings 1219 Laser Diode Technology and Applications II D. Botez and L. Figueroa, eds. pps. 264-275 (1990) D.W. Reicher, S.R. Wilson, C.F. Kranenberg, M.Y.A. Raja, J.R. McNeil and S.R.J. Brueck Photoacoustic Characterization of Surface Absorption Laser-Induced Damage in Optical Materials, SPIE Proceedings, 1441, 106-112 (1990) R.E. Muenchausen, R.C. Dye, R.C. Estler, S. Foltyn, A.R. Garcia, K.M. Hubbard, N.S. Nogar, X.D. Wu, A. Carim, A. Mukherjee, and S.R.J. Brueck Pulsed Laser Processing of High Temperature Superconducting Thin Films Proceedings 4th Intl. SAMPE Electronic Materials Conf. (1990) Saleem H. Zaidi, S.S.H. Naqvi and S.R.J. Brueck Submicrometer Lithographic Alignment and Overlay Strategies X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, R. B. Hoover and A. B. C. Walker, eds, SPIE Proceedings 1343, 241 (1991) S.R.J. Brueck, A. Mukherjee and A.Y. Wu Nonlinear Optics of Thin-Film PLZT Proceedings 12th International Vavilov Conference S.R.J. Brueck Metrology for Semiconductor Manufacturing Semiconductor Technology University White Papers Semiconductor Research Corporation (SRC Technical Report S91023) T. Sze, A. Mahbobzadeh, J. Cheng, S. Hersee, M. Osinski, S.R.J. Brueck, and K.J. Malloy Profiling of MOCVD and MBE-grown VCSEL Wafers for WDM Sources Proc. SPIE 1219, 264-275 (1993) S.R.J. Brueck, Saleem H. Zaidi and M.K. Lang Temperature Measurement for RTP MRS Proceedings 303, Rapid Thermal and Integrated Processing III, J. Gelpey, J.J. Wortman, M. Green ,eds. 117 (1993) Richard A. Myers, N. Mukherjee and S.R.J. Brueck Temporal and Spectral Studies of Large c(2) in Fused Silica in Photosensitivity and Self-Organization in Optical Fibers and Waveguides, SPIE 2044, 1993 Saleem H. Zaidi and S.R.J. Brueck Multiple Exposure Interferometric Lithography SPIE 2197 Optical/Laser Microlithography VII T.A. Brunner, Ed., pp. 869-875 (SPIE, Bellingham, 1994) Saleem H. Zaidi, A. Frauenglass and S.R.J. Brueck Moir‚ Interferometric Alignment and Overlay Techniques SPIE 2196 Integrated Circuit Metrology, Inspection, and Process Control III M.H. Bennett, Ed., pp. 371-382 (SPIE, Bellingham, 1994) S.R.J. Brueck and R.A. Myers Applications of Nonlinear Optical Thin Films MRS Proc. 341 pp. 243-251 (Materials Research Society, Pittsburgh, 1994) D. Burckel, S.H. Zaidi, M.K. Lang, A. Frauenglass and S.R.J. Brueck Speckle Techniques for Noncontact Temperature Measurement MRS Proc. 342 Rapid Themal and Integrated Processing III, J.J. Wortman, J. Gelpey, M.L. Green, S.R.J. Brueck and F. Rooseboom, eds. pp.17-22 (Materials Research Society, Pittsburgh, 1994) R.A. Myers, Xiagcun Long and S.R.J. Brueck Recent Advances in the Second-Order Nonlinear Optical Properties of Amorphous Silica Materials Doped Fiber Devices and Systems, SPIE 2289, 98-109 (1994) R.A. Myers, S.R.J. Brueck and R.P. Tumminelli Stable Second-Order Nonlinearity in SiO2-Based Waveguides on Si using Temperature/Electric-Field Poling Doped Fiber Devices and Systems, SPIE 2289, 158-166 (1994) Saleem H. Zaidi, An-Shyang Chu and S.R.J. Brueck Scalable Fabrication and Optical Characterization of nm Si Structures MRS (Fall’94) 358 957-968 Microcrystalline and Nanocrystalline Semiconductors, eds. Robert W. Collins, Chuang Chuang Tsai Masataka Hirose, Frederick Koch and Louis Brus D. Burckel, S.H. Zaidi and S.R.J. Brueck Sub-Feature Speckle Interferometry: A New Approach to Temperature Measurement MRS 387, Rapid Thermal and Integrated Processing IV, J. Gelpey, J. Sturm, A. Kermani, S.R.J. Brueck, eds. (Materials Research Society, Pittsburgh, 1995).pp. 125-130 J.V. Sandusky and S.R.J. Brueck Correction to the Half-Wave Spacing for Resonant Periodic Gain Structures SPIE 2532 Application and Theory of Periodic Structures, 182-191 (1995) Saleem Zaidi, A-S. Chu and S.R.J. Brueck Room Temperature Photoluminescence from Manufactured 1-D Si Grating Structures Proc. Intl. Conf. on Advanced Electroluminescent Materials, D. J. Lockwood, P. M. Fauchett, N. Koshida and S.R.J. Brueck, eds. The Electrochem. Soc. (95-25, 1996) R.G. Dixon, J. Schneir, T. McWaid, N. Sullivan, V.W. Tsai, S.H. Zaidi, and S.R.J. Brueck Toward Accurate Linewidth Metrology using Atomic Force Microscopy and Tip Characterization SPIE Proc. 2725, Metrology, Inspection, and Process Control for Microlithography, S. K. Jones, ed. pp. 589-607 (1996) Thomas G. Alley, Richard A. Myers and S.R.J. Brueck Temporal Response of the Second-Order Nonlinearity in Poled Bulk-Fused Silica under Field Reversal SPIE Proc. 2841, Doped Fiber Devices, M. J. F. Digonnet and F. Ouellette, eds. pp. 202-208 (1996) X.-C. Long and S.R.J. Brueck Electrooptic Effect and Second-Order Nonlinearity in Poled Silica Fibers SPIE Proc. 2841, Doped Fiber Devices, M. J. F. Digonnet and F. Ouellette, eds. pp. 219-227 (1996) J.V. Sandusky and S.R.J. Brueck Microcavity Effects in an External-Cavity Surface-Emitting Laser SPIE 2994, Physics and Simulation of Optoelectronic Devices V, 300-308 (1997) Jonathan Stohs, David J. Gallant, David J. Bossert and S.R.J. Brueck Epitaxial Structure Dependence of the Linewidth Enhancement Factor in GaAs and In GaAs Quantum Well Lasers SPIE 2994, Physics and Simulation of Optoelectronic Devices V, 542-551 (1997) S.H. Zaidi, S.R.J. Brueck, F.M. Schellenberg, R. Scott Mackay, K. Uekert and J.J. Persoff Interferometric Lithography Tool for 180-nm Structures SPIE Microlithography’97, Emerging Lithographic Technologies, 3048 248-254 (1997) X. Chen, Z. Zhang, S.R.J. Brueck, R.A. Carpio and J.S. Petersen Process Development for 180-nm Structures using Interferometric Lithography and I-Line Photoresist. SPIE Microlithography'97, Emerging Lithographic Technologies, 3048 309-318 (1997) S.R.J. Brueck Perspectives on Nanoscale Lithography Proc. 6th NASA Symposium on VLSI Design S.R.J. Brueck Interferometric Lithography - from Periodic Arrays to Arbitrary Structures Micro and Nano Engineering '97 pp. 145-148 M. Hazatkis and E. Gogolides (Elsevier, Amsterdam, 1998) M.J. O'Brien, V.H. Perez-Luna, L.M. Tender, M. Edmunds, B. Lascelles, S.R.J. Brueck and G.P. Lopez Surface-Plasmon-Resonance-Based Array Biosensors for Multianalyte Detection SPIE Micro- and Nanofabricated Structures and Devices for Biomedical Environmental Applications, P. L. Gourley, ed., 3258, 29-39 (1998). Saleem H. Zaidi, Xiaolan Chen and S.R.J. Brueck Image Reversal at nm-Scales SPIE Microlithography'98, Advances in Resist Technology and Processing, 3333, 1272-1279 (1998) Xiaolan Chen and S.R.J. Brueck Imaging Interferometric Lithography for Arbitrary Patterns SPIE Microlithography’98, Emerging Lithographic Technologies-II Y. Vladmirsky, ed. 3331, 214-224 (1998) Saleem H. Zaidi, S.R.J. Brueck, T. Hill and R.N. Shagam Mix-and-Match Interferometric and Optical Lithographies for Nanoscale Structures SPIE Microlithography’98, Emerging Lithographic Technologies-II Y. Vladmirski, ed. 3331, 406-413, (1998) Xiaolan Chen, A. Frauenglass and S.R.J. Brueck Interferometric Lithography Pattern Delimited by a Mask Image SPIE Microlithography’98, Emerging Lithographic Technologies-II, Y. Vladmirski, ed. 3331 496-502 (1998) V. Metlushko, U. Welp, G. Crabtree, Z. Zhang, S.R.J. Brueck, B. Watkins, L.E. DeLong, B. Ilic, K. Chung and P.J. Hesketh Periodic Arrays of Pinning Centers in Thin Vanadium Films SPIE 3480 Superconducting Superlattices II, I. Bozovic and D. Pavuna, eds, 149-159 (1998) V. Metlushko, U. Welp, G. W. Crabtree, R.M. Osgood III, S.D. Bader, D.G. Hinks, Z. Zhang, S.R.J. Brueck, B. Watkins, L.E. DeLong, B. Ilic, K. Chung, and P.J. Hesketh Superconducting Nanostructured Materials Proc. Electrochem. Soc. (to be published) T.G. Alley, S.R.J. Brueck and M. Wiedenback Thermal Poling and Space Charge Dynamics Including Surface Impurity Injection in Fused Silica SPIE 3542 Doped Fiber Devices II M. Digonnet, F. Ouellette, eds., 108-114 (1998). Neeraj Magotra, Sriram Divakar, Chengjie Tu, S.R.J. Brueck and Xiaolan Chen Digital Image Processing Applied to Imaging Interferometric Lithography IEEE Asilomar Conference on Signals, Systems and Computers H. Radakrishna, S. Divakar, N. Magotra, S.R.J. Brueck and A. Waters MPI-Based Parallel Implementation of a Lithography Pattern Simulation Algorithm 7th International Conference for High Performance Computing and Networking, Amsterdam, The Netherlands (to be published) Saleem H. Zaidi and S.R.J. Brueck Interferometric Lithography for Nanoscale Fabrication Proc. SPIE 3618 Laser Applications in Microelectronic and Optoelectronic Manufacturing IV, 2-8, 1999. Saleem H. Zaidi and S.R.J. Brueck Nonlinear Processes to Extend Interferometric Lithography Proc. SPIE 3676 Microlithography Emerging Technologies III, 371-378, 1999. S.R.J. Brueck and Xiaolan Chen Spatial Frequency Analysis of Optical Lithography Resolution Enhancement Techniques Proc. SPIE 3679 Optical Microlithography, 715-725 (1999) Xiaolan Chen and S.R.J. Brueck Experimental Comparison of Off-Axis Illumination and Imaging Interferometric Lithography Proc. SPIE 3679 Optical Microlithography, 736-744 (1999) Saleem Zaidi and S.R.J. Brueck Nanoscale Fabrication by Interferometric Lithography Proc. SPIE 3740 Optical Engineering for Sensing and Nanotechnology 340-343 (1999) Saleem H. Zaidi, James M. Gee, Douglas S. Ruby, and S.R.J. Brueck Characterization of Si Nanostructured Surfaces Proc. SPIE 3790 Engineered Nanostructural Films and Materials, 151-159 (1999) V. Metlushko, B. Ilic, H. Koo, R.D. Gomez, U. Welp, G. Crabtree, W. Fan, S.R.J. Brueck, P. Neuzil, and R. Kumar Current Modulation in Superconducting/Magnetic Nanostructured Materials Proc. Intl. Semicon. Device Res. Symp. 547-550 (1999) S.R.J. Brueck Imaging Interferometric Lithography: Extending Optics to Fundamental Limits and Beyond Proc. SPIE 3749, International Commission on Optics International Meeting, 360-361 (1999) E.M. Rabinovich, M.J. O'Brien, S.R.J. Brueck, S. Yang, V.H. Perez-Luna, and G.P. Lopez Compact Phase-Sensitive Multichannel Detection System with Array Measurements of Biosensor Chips Proc. SPIE BiOS-2000 3926, 181-185 (2000) X.-C. Long, S.R.J. Brueck and Monica L. Minden A High-Speed Poled All-Fiber Switch Bragg Gratings, Photosensitivity and Poling in Glass Waveguides, OSA Topics in Optical Science and Technology 33, 355-359 (2000) T.G. Alley, S.R.J. Brueck and M. Wiedenbeck Space Charge in Thermally Poled Fused Silica Bragg Gratings, Photosensitivity and Poling in Glass Waveguides, OSA Topics in Optical Science and Technology 33, 379-381 (2000) M.J. O'Brien, E. Rabinovich, T. Svimonishvilli, S.R.J. Brueck and G.P. Lopez Optoelectronic Closed-Loop Auto-Oscillator for Fluorescence Lifetime Detection: a New Fluorimetry Technique with Application to Chemical/Biosensors Proc. SPIE, BiOS-2001 4263, 121-128 (2001) E.M. Rabinovich, T. Svimonishvili, M.J. O'Brien, S.R.J. Brueck, T. Buranda, L.A. Sklar and G.P. Lopez Development of a New Detection Technique for Fluorescence-Lifetime-Based Chemical/Biological Sensor Arrays Monitoring: Dual Closed Loop Optoelectronic Auto-Oscillatory Detection Circuit Proc. SPIE BiOS-2002 4624, 115 – 122, (2002) S.R.J. Brueck Nanostructures for Environmental Sensing BTR 2002 Unified Science & Technology for Reducing Biological Threats & Countering Terrorism (The University of New Mexico, Albuquerque, 2002) Christian Schwarz, Yulia Kuznetsova and S.R.J. Brueck Imaging Inteferometric Microscopy for Enhanced Resolution Proc. SPIE Metrology, Inspection, and Process Control for Microlithography XVI, 4689, 802-811 (2002) A. K. Raub and S.R.J. Brueck Deep UV Immersion Interferometric Lithography Proc. SPIE 5040, Optical Microlithography XVI, 667-678 (2003) Eric S. Wu, Balu Santhanam and S.R.J. Brueck Grating Analysis of Frequency Parsing Strategies for Imaging Inteferometric Lithography Proc. SPIE 5040, Optical Microlithography XVI, 1267-1283 (2003) Christian J. Schwarz, Yuliya Kuznetsova and S.R.J. Brueck Demonstration of Imaging Interferometric Microscopy Proc. SPIE 5038, Metrology, Inspection and Process Control XVII 1-12 (2003) S.C. Lee, X.Y. Sun, S.D. Hersee, F. Xu and S.R.J. Brueck Growth of GaN on a Nanoscale Faceted Si Substrate by Metal-Organic Vapor Phase Epitaxy Proc. Int’l Symposium on Compound Semiconductors Thanis M. Tridhavee, Balu Santhanam and S.R.J. Brueck Optimization and apodization of aerial images at high NA for imaging interferometric lithography Proc. SPIE 5377, 1544–1554 (2004) A.K. Raub, A. Frauenglass, S.R.J. Brueck, W. Conley, R. Dammel, A. Romano, M. Sato and W. Hinsberg Deep-UV Immersion Interferometric Lithography Proc. SPIE 5377, 306-318 (2004) Abani. M. Biswas, A. Frauenglass, and Steven R.J. Brueck Simulation of the 45-nm Half-Pitch Node with 193-nm Immersion Lithography Proc. SPIE 5377, 1579-1586 (2004) S.R.J. Brueck and Abani. M. Biswas Extension of 193-nm Immersion Optical Lithography to the 22-nm Half-Pitch Node Proc. SPIE 5377, 1315-1322 (2004) Q. Li, Y-B. Jiang, J.L. Krauss, H. Xu, S.R.J. Brueck, S. Hersee and S.M. Han Heteroepitaxy of High-Quality Ge on Si by Nanoscale Seed Pads Growng through a SiO2 Interlayer Proc. SPIE 5734, 75 - 82 (2005) J.J. Wierer, M.R. Krames, J.E. Epler, N.F. Gardner, J.R. Wendt, M.M, Sigalas, S.R.J. Brueck, D. Li, and M. Shagam III-Nitride LEDs with Photonic Crystal Structures Proc. SPIE 5739, 102-107 (2005) O. Levi, W. Suh, M. M. Lee, J. Zhang, S. R. J. Brueck, S. Fan, and J. S. Harris Integrated Biomedical Nanosensor using Guided Resonance in Photonic Crystal Structures Proc. SPIE 6095 (to be published) A. K. Raub, A. M. Biswas, Y. Borodovsky, G. Allen and S. R. J. Brueck Simulation of Dense Contact Hole (k1 = 0.35) Arrays with 193-nm Immersion Lithography Proc. SPIE 6154 (to be published) S. Smolev, A. Biswas, A. Frauenglass and S. R. J. Brueck 244-nm Imaging Interferometric Lithography Test Bed Proc. SPIE 6154 (to be published)   | HOME | RESUME | PUBLICATIONS | STUDENTS | | RESEARCH | EMPLOYMENT OPPORTUNITIES | LINKS | HOBBIES|