Patent issued to CHTM inventors Brueck, Kuznetsova, and Neumann

January 13, 2017 - CHTM

Steven R. J. Brueck

Steven R. J. Brueck

The Science & Technology Corporation at the University of New Mexico (STC.UNM or STC), announces that a new patent has been issued to researchers with the UNM Center for High Technology Materials (CHTM). As the technology transfer and economic development organization for the University of New Mexico (UNM), STC.UNM protects and commercializes technologies developed at UNM by filing patents and copyrights and transferring the technologies to the marketplace.

U.S. Patent No. 9,541,374, “Structural illumination and evanescent coupling for the extension of imaging interferometric microscopy," has been issued to Brueck et al. by the U.S. Patent & Trademark Office (USPTO). Steven R. J. Brueck, Yulia Kuznetsova, and Alexander Neumann are listed as inventors.

Brueck is a Distinguished Professor Emeritus of Electrical & Computer Engineering and Physics & Astronomy at UNM, and Director Emeritus of CHTM. Brueck has made significant contributions to nonlinear optics, nanoscale lithography, semiconductor lasers, infrared detectors, nanophotonics and nanofluidics. He holds over 60 patents, of which 63 licenses and options have been exercised by 24 companies. Brueck is a fellow of OSA, IEEE, and AAAS. Kuznetsova is a Research Assistant Professor with CHTM and has been recognized in the STC.UNM Spotlight for her research and accomplishments as an innovator. She earned her Ph.D. in Optics from UNM in 2007. Neumann is a Post Doctoral Fellow with CHTM.

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Abstract

In accordance with the aspects of the present disclosure, a method and apparatus is disclosed for three-dimensional imaging interferometric microscopy (IIM), which can use at least two wavelengths to image a three-dimensional object. The apparatus can include a first, a second, and a third optical system. The first optical system is disposed to provide a substantially coherent illumination to the 3D object, wherein the illumination is characterized by a plurality of wavelengths. The second optical system includes an optical image recording device and one or more additional optical components characterized by a numerical aperture NA. The third optical system provides interferometric reintroduction of a portion of the coherent illumination as a reference beam into the second optical system. An image recording device records each sub-image formed as a result of interference between the illumination that is scattered by the 3D object and the reference beam.

This invention relates generally to microscopy, and, more particularly, to an imaging interferometric microscope.

Background

Optical microscopy is among the oldest applications of optical science and remains one of the most widely used optical technologies. In spite of impressive results obtained by fluorescent microscopy in exceeding the classical diffraction limit, non-fluorescent transmission/reflection microscopy remains an important field of modern research. However, using traditional illumination schemes, resolution is limited.


Source:
U.S. Patent No. 9,541,374